Sensor With Multiple Sub - radix - 2 SAR ADC Calibration and Residual Column Pattern Noise Correction

Conclusion We developed PFM-ADCs with a novel event-driven CDS technique. Measurement results demonstrated inpixel noise reduction effects of below 1% and a wide dynamic range of 120 dB with an excellent linearity. The ADCs are promising for the pixel-parallel 3-D integrated image sensor with ultimate performances. References [1] R. Funatsu et al., “133Mpixel 60fps CMOS Image Sensor with 32-Column Shared High-Speed Column-Parallel SAR ADCs,” in IEEE Int. SolidState Circuits Conf. Dig. Tech. Papers (ISSCC), Feb. 2015, pp. 112–113. [2] M. Goto et al., “Three-Dimensional Integrated CMOS Image Sensors with Pixel-Parallel A/D Converters Fabricated by Direct Bonding of SOI Layers,” in IEEE Int. Electron Devices Meeting (IEDM) Tech. Dig., Dec. 2014, pp. 4.2.1–4.2.4. [3] M. Goto et al., “Pixel-Parallel 3-D Integrated CMOS Image Sensors With Pulse Frequency Modulation A/D Converters Developed by Direct Bonding of SOI Layers,” IEEE Trans. Electron Devices, vol. 62, no. 11, pp. 3530–3535, 2015. [4] M. Goto et al., “In-Pixel A/D Converters with 120dB Dynamic Range Using Event-Driven Correlated Double Sampling for Stacked SOI Image Sensors,” in Proc. IEEE SOI-3D-Subthreshold Microelectron. Technol. Unified Conf. (S3S) Conf., 2016, 6b.3. [5] M. Goto et al., “A Three-Dimensional Integration Technology with Embedded Au Electrodes for stacked CMOS Image Sensors,” in Proc. 2015 Int. Image Sensor Workshop (IISW), 2015, pp. 48–50. [6] F. Andoh, H. Shimamoto, and Y. Fujita, “A Digital Pixel Image Sensor for Real-Time Readout,” IEEE Trans. Electron Devices, vol. 47, no. 11, pp. 2123– 2127, 2000. [7] M. White et al., “Characterization of charge-coupled device line and area-array imaging at low light levels,” in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers (ISSCC), Feb. 1973, pp. 134–135. [8] J. Hynecek, “A New Device Architecture Suitable for High-Resolution and High-Performance Image Sensors,” IEEE Trans. Electron Devices, vol. 35, no. 5, pp. 646–652, 1988. P25 Image Sensor With Multiple Sub-radix-2 SAR ADC Calibration and Residual Column Pattern Noise Correction Daniel Van Blerkom, Steve Huang, Barmak Mansoorian Forza Silicon Corporation, 2947 Bradley St, Suite 130, Pasadena, California, 91107, USA contact: [email protected], +1-626-796-1182 x 111